← Public tenders – Netherlands
Offers accepted until 7 Sept 2026 Netherlands

Metrology SEM+FIB system

Contracting authority
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO · Reg. no. 252056395
Sector
CPV 31712000
Estimated value
€1,300,000
Published
27 Jul 2026
Submission deadline
7 Sept 2026

Tender description

The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem

Documents (5)

  • TN604044 - EF16 Aankondiging van een opdracht - algemene richtlijn, standaardregeling 20260727143716bin
  • Public Tender Metrology SEM+FIBbin
  • Part Cbin
  • Part Bbin
  • Part Abin

Document downloads are available after free registration — 7-day trial, no card required.

Get documents

View on the source portal ↗

Don't miss the next tender

Veritra checks every public procurement portal daily and sends you new tenders for your sector and region — by email, mobile app, or straight into your system. First 7 days free.

Try for free

Similar active tenders